Proceedings of The 17th Asian Test Symposium - November 24-27, 2008,Sapporo, Japan free download online
Title: Proceedings of The 17th Asian Test Symposium - November 24-27, 2008,Sapporo, Japan Author(s): IEEE Pages: 480 Publisher: IEEE Publication date: 2008 Language: English Format: PDF ISBN-10: 0769533964 ISBN-13: Description: Foreword
Proceedings of the 17th Asian Test Symposium
Welcome to the Seventeenth Asian Test Symposium (ATS08). Since 1992, ATS has been held every year in
various Asian cities as the largest symposium that focuses on testing of integrated circuits and systems. Many
researchers and engineers from all over the world have attended the past symposia and enjoyed discussions.
This year ATS is being held in Sapporo, Japan.
We have received 152 technical paper submissions from 19 countries and regions, including 37 from North and
South America, 18 from Europe, 28 from Japan, 23 from Mainland China, 21 from Taiwan, 11 from India, 7
from Korea, 6 from other Asian countries and regions, and 1 from Africa. Each paper was sent to at least three
reviewers for evaluation. The Program Committee meeting was held on July 4, 2008, at Campus Innovation
Center Tokyo, and 62 papers were selected based on the reviewers rating and comments. The selected papers,
which cover nearly all aspects of the key area of VLSI testing, were allocated into 20 technical sessions. We
have also received 15 industry paper submissions and selected 12 of them to form an industry session.
In addition to the technical and industry sessions, the ATS program includes two plenary sessions, two special
sessions on analog production test, one panel session and two half-day tutorials. Two keynote addresses and
two invited talks in the plenary sessions are given by Dr. Brian Stevens, Dr. Kunio Uchiyama, Dr. Brady
Benware and Prof. Kunihiro Asada. Special session on analog production test is organized by Dr. Fidel
Muradali and Dr. Jochen Rivoir. One panel session is organized by Dr. Anis Uzzaman. Two half-day tutorials
are offered in cooperation with the Test Technology Test Education Program (TTEP) of IEEE Computer
Society, Test Technology Technical Council (TTTC). One is on statistical screening methods by Prof. Adit
Singh and the other is on delay testing by Dr. Srinivas Patil and Dr. Sreejit Chakravarty.
Finally we would like to thank the reviewers, the Program Committee members, the Organizing Committee
members, and the ATS Steering Committee members for their cooperation. And we also thank to all the authors
who submitted their work to ATS 2008, and the program participants for their contribution at the symposium.
Seiji Kajihara
General Co-Chair
Kyushu Institute of Technology
Yasuo Sato
General Co-Chair
Hitachi, Ltd.
Kazumi Hatayama
Program Chair
STARC
Hiroshi Takahashi
Program Vice-Chair
Ehime University
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17th Asian Test Symposium
ATS 2008
Table of Contents
Foreword................................................................................................................................................................xii
ATS Steering Committee.............................................................................................................................xiii
Organizing Committee..................................................................................................................................xiv
Program Committee........................................................................................................................................xv
Reviewers............................................................................................................................................................xvii
TTTC Activities Board.................................................................................................................................xviii
Tutorial 1................................................................................................................................................................xxi
Tutorial 2..............................................................................................................................................................xxii
ATS 2007 Best Paper Award....................................................................................................................xxiii
Session 1: Plenary Session 1
Session 2: Plenary Session 2
Session 3A: Test Data & Response Compression
Not All Xs are Bad for Scan Compression ..............................................................................................................7
Anshuman Chandra and Rohit Kapur
Evaluation of Entropy Driven Compression Bounds on Industrial Designs ....................................................13
Srinivasulu Alampally, Jais Abraham, Rubin A. Parekhji, Rohit Kapur, and T.W. Williams
Session 3B: Test Generation and Fault Simulation
Untestable Fault Identification in Sequential Circuits Using Model-Checking ...............................................21
Jaan Raik, Hideo Fujiwara, Raimund Ubar, and Anna Krivenko
A Test Generation Method for State-Observable FSMs to Increase Defect
Coverage under the Test Length Constraint ..........................................................................................................27
Ryoichi Inoue, Toshinori Hosokawa, and Hideo Fujiwara
LIFTING: A Flexible Open-Source Fault Simulator ...........................................................................................35
Alberto Bosio and Giorgio Di Natale
v
Session 3C: RF Testing
Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs .........................................................................43
Hsiu-Ming (Sherman) Chang, Min-Sheng (Mitchell) Lin, and Kwang-Ting (Tim) Cheng
Low-Cost One-Port Approach for Testing Integrated RF Substrates ................................................................49
Abhilash Goyal and Madhavan Swaminathan
Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems ...................................................55
Deuk Lee, Vishwanath Natarajan, Raj Senguttuvan, and Abhijit Chatterjee
Session 4A: Test Compression and BIST
Interconnect-Driven Layout-Aware Multiple Scan Tree Synthesis for Test
Time, Data Compression and Routing Optimization ...........................................................................................63
Katherine Shu-Min Li and Jr-Yang Huang
Sequential Circuit BIST Synthesis Using Spectrum and Noise from ATPG
Patterns .......................................................................................................................................................................69
Nitin Yogi and Vishwani D. Agrawal
A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test
Itself ............................................................................................................................................................................75
Jishun Kuang, Xiong Ouyang, and Zhiqiang You
Session 4B: Test Generation for Physical Faults
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced
Faults ..........................................................................................................................................................................83
Sunghoon Chun, Yongjoon Kim, Taejin Kim, Myung-Hoon Yang, and Sungho Kang
A Multi-valued Algebra for Capacitance Induced Crosstalk Delay Faults .......................................................89
Arani Sinha, Sandeep K. Gupta, and Melvin A. Breuer
Increasing Defect Coverage by Generating Test Vectors for Stuck-Open Faults ...........................................97
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi,
and Yuzo Takamatsu
Session 4C: Analog and Mixed-Signal Test
Technique to Improve the Performance of Time-Interleaved A-D Converters
with Mismatches of Non-linearity .........................................................................................................................105
Koji Asami, Hidetaka Suzuki, Hiroyuki Miyajima, Tetsuya Taura, and Haruo Kobayashi
A Reduced Code Linearity Test Method for Pipelined A/D Converters ................................
Proceedings of The 17th Asian Test Symposium - November 24-27, 2008,Sapporo, Japan free download links:
Title: Proceedings of The 17th Asian Test Symposium - November 24-27, 2008,Sapporo, Japan